Cindbest manual probe station system

The Cindbest CH-8 is a high-precision 200 mm manual probe station designed for advanced wafer-level testing and microelectronic characterisation. Built for applications in wafer-level reliability (WLR), failure analysis (FA), MEMS, and high-power device testing, the CH-8 supports IV, CV, RF and high-voltage measurements with exceptional mechanical stability and measurement accuracy. Its precision X-Y air-floating stage provides 1 µm movement accuracy, enabling efficient sample positioning and repeatable probing performance even under demanding test conditions.

Engineered for ergonomic operation, the CH-8 features an adjustable needle seat platform with quick lift and fine-tune functions, a 360° rotatable chuck with angle locking, and vacuum adsorption for secure wafer fixation. The system accommodates a wide range of DC/RF micro-positioners, high-power microscopes and various chuck options including room-temperature, high-temperature and back-electrode configurations. Temperature-controlled chucks (RT-200 °C, upgradable to 300 °C) ensure stability and reliability for thermal stress and power device testing.

For enhanced performance, the CH-8 can be integrated with the CB-6 light-tight shielding enclosure and air-floating vibration-proof tables, minimising external interference and ensuring measurement integrity. Combined with Cindbest’s range of high-voltage, RF, and Kelvin probe fixtures, the CH-8 delivers comprehensive flexibility for semiconductor R&D, device verification, and high-accuracy analytical testing environments.

The Motic PSM-1000 is a precision metallographic microscope designed for high-power microscopic observation, offering unmatched clarity and stability for wafer, MEMS, and microelectronic analysis. With a robust optical system and ergonomic design, it supports advanced spot testing and laser alignment in semiconductor and materials science applications. Its optical path delivers clear, distortion-free imaging across magnifications, enabling detailed surface morphology inspections and microstructure analysis.

Equipped with a 1X–2X zoom range and 10X or 20X eyepiece options, the PSM-1000 achieves up to 2000X or 4000X total magnification, ensuring exceptional visual performance for metallurgical, defect, and pad analysis tasks. The manual 4-hole nosepiece accommodates multiple objectives (5X/10X/20X/50X/100X), while the Z-axis focusing travel of 50.8 mm ensures fine precision during observation. A 0.5X C-mount adapter allows seamless integration with digital imaging systems for real-time data capture and documentation.

Driven by a 150W high-power white light source, the PSM-1000 delivers bright, consistent illumination ideal for reflective and high-contrast surfaces. Its reliability and optical accuracy make it a preferred choice for professional laboratories and probe station setups such as the Cindbest CH Series. Engineered for performance and durability, the Motic PSM-1000 represents a trusted tool for engineers and researchers who demand consistent, high-resolution metallographic imaging in advanced analytical environments.