Cindbest manual probe station system

The Cindbest CH-8 is a high-precision 200 mm manual probe station designed for advanced wafer-level testing and microelectronic characterisation. Built for applications in wafer-level reliability (WLR), failure analysis (FA), MEMS, and high-power device testing, the CH-8 supports IV, CV, RF and high-voltage measurements with exceptional mechanical stability and measurement accuracy. Its precision X-Y air-floating stage provides 1 µm movement accuracy, enabling efficient sample positioning and repeatable probing performance even under demanding test conditions.

Engineered for ergonomic operation, the CH-8 features an adjustable needle seat platform with quick lift and fine-tune functions, a 360° rotatable chuck with angle locking, and vacuum adsorption for secure wafer fixation. The system accommodates a wide range of DC/RF micro-positioners, high-power microscopes and various chuck options including room-temperature, high-temperature and back-electrode configurations. Temperature-controlled chucks (RT-200 °C, upgradable to 300 °C) ensure stability and reliability for thermal stress and power device testing.

For enhanced performance, the CH-8 can be integrated with the CB-6 light-tight shielding enclosure and air-floating vibration-proof tables, minimising external interference and ensuring measurement integrity. Combined with Cindbest’s range of high-voltage, RF, and Kelvin probe fixtures, the CH-8 delivers comprehensive flexibility for semiconductor R&D, device verification, and high-accuracy analytical testing environments.

The Motic PSM-1000 is a precision metallographic microscope designed for high-power microscopic observation, offering unmatched clarity and stability for wafer, MEMS, and microelectronic analysis. With a robust optical system and ergonomic design, it supports advanced spot testing and laser alignment in semiconductor and materials science applications. Its optical path delivers clear, distortion-free imaging across magnifications, enabling detailed surface morphology inspections and microstructure analysis.

Equipped with a 1X–2X zoom range and 10X or 20X eyepiece options, the PSM-1000 achieves up to 2000X or 4000X total magnification, ensuring exceptional visual performance for metallurgical, defect, and pad analysis tasks. The manual 4-hole nosepiece accommodates multiple objectives (5X/10X/20X/50X/100X), while the Z-axis focusing travel of 50.8 mm ensures fine precision during observation. A 0.5X C-mount adapter allows seamless integration with digital imaging systems for real-time data capture and documentation.

Driven by a 150W high-power white light source, the PSM-1000 delivers bright, consistent illumination ideal for reflective and high-contrast surfaces. Its reliability and optical accuracy make it a preferred choice for professional laboratories and probe station setups such as the Cindbest CH Series. Engineered for performance and durability, the Motic PSM-1000 represents a trusted tool for engineers and researchers who demand consistent, high-resolution metallographic imaging in advanced analytical environments.

The Cindbest CB-M200 stereo microscope delivers outstanding optical clarity and precision for micro-inspection and large-pad device testing. Designed for applications requiring accurate visual analysis under low-power magnification, it provides a zoom range from 0.8X to 5X, ensuring flexible observation from general inspection to fine structural detail. The integrated LED ring light produces bright, shadow-free illumination, while the high-precision Z-axis focusing system with a 50.8 mm range enables smooth and stable focusing across various sample heights.

Built for compatibility with Cindbest’s CH-series probe stations and other precision platforms, the CB-M200 supports optional 2X auxiliary objectives, achieving magnifications up to 200X with a minimum resolution of 2 µm. The 20X eyepieces and 0.4X C-mount adapter ensure comfortable binocular viewing and compatibility with digital cameras for image capture or live monitoring. This makes it ideal for semiconductor testing, MEMS inspection, and general microelectronic device analysis, where both depth and field clarity are critical.

Engineered for ergonomic performance and durability, the CB-M200 provides extended working distance and stable mechanical alignment, reducing operator fatigue during long inspection sessions. Whether used for visual fault analysis, precision assembly, or educational research, it delivers the reliability and optical fidelity that professionals demand in a compact, high-performance stereo observation system.

The Cindbest 0745 is a precision-engineered monocular metallographic microscope designed for high-accuracy microstructure observation and surface measurement in semiconductor and microelectronic applications. Featuring a continuous zoom ratio of 0.75–5X and a standard 1X objective lens, it delivers sharp, distortion-free imaging across a broad range of magnifications. With a working distance of 82 mm and optional metallographic lenses (5X–50X), the 0745 ensures flexibility for both large and small pad inspections, making it ideal for wafer-level analysis, device failure evaluation, and material quality testing.

Built for stability and optical performance, the Cindbest 0745 integrates a coaxial light source that ensures uniform illumination across reflective and non-reflective surfaces. Its C-Mount 1X adapter supports easy connection to digital imaging systems for real-time viewing and documentation, enhancing workflow efficiency in R&D and production test environments. The microscope’s robust structure and fine mechanical control enable precise focusing with minimal vibration, ensuring consistent measurement accuracy down to 2 μm resolution.

Optimised for integration into Cindbest CH-series probe stations, the 0745 delivers dependable performance in semiconductor probing, MEMS analysis, and metallurgical quality inspection. It combines ergonomic operation with high optical clarity, providing a compact yet powerful solution for engineers and researchers who require reliable, repeatable imaging performance in advanced testing setups.

The 8-inch chuck is designed for precision wafer testing under elevated temperature conditions where back electrode measurements are required. Crafted from copper with a gold-plated surface, it ensures superior thermal conductivity and excellent electrical contact stability, minimizing resistance and thermal drift during prolonged test cycles. Its annular vacuum adsorption system, built with a four-ring layout and 1mm pore structure, provides firm wafer fixation for consistent and repeatable measurement accuracy.

Engineered for compatibility with Cindbest’s CH Series probe stations, this chuck operates reliably from room temperature up to 200 °C, and can be upgraded for performance up to 300 °C. Temperature control precision reaches 0.1 °C with stability within ±1 °C, enabling dependable operation for demanding wafer-level reliability (WLR), high-power, and MEMS device characterization. The structure’s electrical independence supports back electrode testing by allowing accurate current or voltage feedthrough from the rear of the wafer.

Ideal for advanced analytical and reliability testing, the chuck’s robust thermal and electrical performance ensures high integrity results in semiconductor process evaluation, IC failure analysis, and device qualification. When integrated with a temperature-controlled probe station, it provides a stable testing platform that enhances throughput, reproducibility, and operator safety during high-temperature evaluations.

The Cindbest CB-40 Micropositioner is a compact, precision positioning unit designed for probe stations and wafer-level testing systems requiring stable and reliable probe alignment. With an X-Y-Z travel range of 13 mm and a magnetic base, it provides smooth, consistent motion across all axes, ensuring accurate probe placement for general-purpose electrical measurements and pad-level contact testing. Its durable, lightweight construction allows for efficient workspace configuration and easy integration into Cindbest’s CH Series and other analytical probe systems.

Engineered for practicality and cost-effectiveness, the CB-40 delivers dependable performance in environments where fine positioning is required but ultra-high resolution is not critical. Its stable magnetic mounting base ensures quick setup and secure attachment, allowing users to achieve repeatable positioning with minimal mechanical drift. This makes the CB-40 particularly suitable for DC, IV, and CV testing, as well as basic failure analysis and microcircuit evaluation applications.

As part of Cindbest’s professional range of probe station accessories, the CB-40 represents a balance between performance, affordability, and usability. It is ideal for laboratories, academic research, and production testing setups seeking a reliable micropositioning solution without the higher cost of submicron systems. Robust, easy to maintain, and precisely engineered, the CB-40 delivers consistent alignment and motion control, reinforcing Cindbest’s reputation for excellence in wafer probing technology.

The Cindbest CB-40-T is a compact and efficient probe holder designed for stable and accurate electrical probing across a wide range of wafer and device testing applications. Its movement accuracy of 2 µm and XYZ travel range of 12 mm ensure reliable positioning and repeatable measurements, making it ideal for use in semiconductor characterization, wafer-level reliability (WLR) and device failure analysis. Despite its small footprint, the CB-40-T maintains excellent stability and precision even under continuous test conditions.

Engineered for versatility and ergonomics, the CB-40-T can be configured with magnetic or vacuum adsorption fixation, enabling rapid setup and easy integration into both manual and semi-automated probe stations. Its robust build supports pad and large-contact probing, providing steady contact with minimal signal noise and mechanical drift. The smooth linear motion and fine control allow users to confidently test a variety of device geometries and materials with high reproducibility.

Designed as a cost-effective solution without compromising performance, the CB-40-T delivers the balance of accuracy, size,and affordability needed in research laboratories, production testing, and quality control environments. When paired with Cindbest’s CH-Series probe stations and optical systems, it forms part of a complete, high-precision testing ecosystem—ensuring consistent results and long-term reliability in demanding semiconductor measurement applications.

The Cindbest CB-100 is a high-accuracy probe holder designed to meet the stringent demands of semiconductor wafer testing and advanced analytical probing. Engineered with 0.7 μm motion precision across X, Y and Z axes, the CB-100 delivers exceptional stability and repeatability in DC, RF and fiber-optic applications. Its robust linear motion system ensures smooth, vibration-free positioning — ideal for precise electrical characterisation, microcircuit diagnostics and nanoscale contact verification.

Developed for integration into Cindbest’s CH Series probe stations, the CB-100 offers universal adaptability and modular compatibility with a range of probe cards and optical inspection setups. The compact form factor allows for flexible placement, while the interchangeable fixture heads enable seamless transition between DC, RF and optical probing tasks without compromising accuracy. This versatility makes it a preferred choice for wafer-level reliability (WLR), failure analysis (FA) and MEMS device testing environments.

Built with high-quality materials and precision components, the CB-100 ensures long-term performance consistency even under demanding lab conditions. It supports probing as fine as 1 µm, offering unmatched reliability for engineers requiring repeatable and traceable data across diverse testing regimes. Whether used for production validation or R&D experimentation, the CB-100 embodies Cindbest’s commitment to precision, innovation, and reliability in analytical test systems.

The Cindbest CB-200 is a high-precision XYZ linear motion probe holder engineered for advanced wafer probing and microelectronic testing environments. Designed to deliver exceptional positioning accuracy of 0.5 µm, it supports probing applications as small as 1 µm, ensuring reliable contact and repeatability in both R&D and production test systems. Its 20 mm travel range across all axes allows for smooth, stable adjustments during delicate micro-contact operations, ideal for use in high-end analytical probe systems such as the Cindbest CH Series.

Built for versatility, the CB-200 can be configured for DC, RF or fiber optic applications, offering broad compatibility across device characterization, RF measurement and optoelectronic testing. The compact form factor and robust mechanical design minimize vibration and drift, enhancing stability even during long-duration or high-precision measurement tasks. Its linear translation mechanism ensures consistent probe alignment with minimal backlash, meeting the demands of nano-scale testing accuracy.

Engineered with Cindbest’s commitment to precision and reliability, the CB-200 provides an optimal solution for engineers requiring dependable and repeatable probing at the micro level. It integrates seamlessly into wafer-level reliability (WLR), failure analysis (FA) and MEMS testing workflows, where sub-micron precision is critical. Whether deployed in manual or semi-automated setups, the CB-200 embodies Cindbest’s high-performance engineering philosophy—delivering accuracy, flexibility, and control for next-generation semiconductor testing.